MICROELECTRONICS RELIABILITY 期刊简介
Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.
Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.
微电子可靠性,致力于传播微电子器件、电路和系统可靠性的最新研究成果和相关信息,从材料、工艺和制造,到设计、测试和操作。该期刊的覆盖范围包括以下主题: 测量,理解和分析; 评估和预测; 建模和模拟; 方法和缓解。将可靠性与微电子工程的其他重要领域 (例如设计,制造,集成,测试和现场操作) 相结合的论文也将受到欢迎,特别鼓励报告该领域和特定应用领域案例研究的实用论文。
大多数被接受的论文将作为研究论文发表,描述重大进展和已完成的工作。评论具有普遍兴趣的重要发展主题的论文可以作为评论论文被接受发表。可以考虑将具有更初步性质的紧急通讯和有关当前感兴趣的已完成实际工作的简短报告作为研究说明出版。所有贡献都要接受该领域领先专家的同行审查。
期刊ISSN
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0026-2714 |
影响指数
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1.573 |
最新CiteScore值
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3.60 查看CiteScore评价数据 |
最新自引率
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15.70% |
官方指定润色网址
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https://www.deeredit.com/?type=ss1 |
投稿语言要求
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Improve the quality of the paper, eliminate grammar and spelling errors, increase readability, ensure accurate communication of viewpoints, enhance academic reputation, and increase the chances of the paper being accepted. 建议点击这个网址:https://www.deeredit.com/?type=ss2,资深审稿专家为您评估稿件质量,提供针对性改进建议,最终可助您极大提升目标期刊录用率 |
期刊官方网址
hot |
https://www.peipusci.com/?type=9 |
杂志社征稿网址
hot |
https://www.peipusci.com/?type=10 |
通讯地址
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PERGAMON-ELSEVIER SCIENCE LTD, THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD, ENGLAND, OX5 1GB |
偏重的研究方向(学科)
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工程技术-工程:电子与电气 |
出版周期
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Monthly |
出版年份
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1964 |
出版国家/地区
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ENGLAND |
是否OA
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No |
SCI期刊coverage
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Science Citation Index Expanded(科学引文索引扩展) |
NCBI查询
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PubMed Central (PMC)链接 全文检索(pubmed central) |
最新中科院JCR分区
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大类(学科)
小类(学科)
综述期刊
工程技术
ENGINEERING, ELECTRICAL & ELECTRONIC(工程:电子与电气)4区
NANOSCIENCE & NANOTECHNOLOGY(纳米科技)4区
PHYSICS, APPLIED(物理:应用)4区
否
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最新的影响因子
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1.573 | |||||
最新公布的期刊年发文量 |
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总被引频次 | 80 | |||||
影响因子趋势图 |
近年的影响因子趋势图(整体平稳趋势)
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2022年预警名单预测最新
最新CiteScore值
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3.60
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年文章数 | 344 | ||||||||||||||||||||||||||||||
SJR
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0.445 | ||||||||||||||||||||||||||||||
SNIP
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0.981 | ||||||||||||||||||||||||||||||
CiteScore排名
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CiteScore趋势图 |
CiteScore趋势图
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本刊同领域相关期刊
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期刊名称 | IF值 |
METROLOGIA | 3.125 |
REVIEW OF SCIENTIFIC INSTRUMENTS | 1.508 |
Journal of X-Ray Science and Technology | 1.52 |
Quantitative InfraRed Thermography Journal | 1.65 |
MAPAN-Journal of Metrology Society of India | 0.999 |
Nanoscale | 7.712 |
Nanotechnology Reviews | 7.77 |
Applied Sciences-Basel | 2.652 |
Journal of Experimental Nanoscience | 3.044 |
本刊同分区等级的相关期刊
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|
期刊名称 | IF值 |
REVIEW OF SCIENTIFIC INSTRUMENTS | 1.508 |
Journal of X-Ray Science and Technology | 1.52 |
Quantitative InfraRed Thermography Journal | 1.65 |
MAPAN-Journal of Metrology Society of India | 0.999 |
ATOMIZATION AND SPRAYS | 0.811 |
International Journal of Surface Science and Engineering | 1.166 |
QUANTUM ELECTRONICS | 1.012 |
OPTO-ELECTRONICS REVIEW | 2.464 |
MICROELECTRONIC ENGINEERING | 2.498 |
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