MAPAN-Journal of Metrology Society of India 期刊简介
MAPAN-Journal Metrology Society of India is a quarterly publication. It is exclusively devoted to Metrology (Scientific, Industrial or Legal). It has been fulfilling an important need of Metrologists and particularly of quality practitioners by publishing exclusive articles on scientific, industrial and legal metrology.
The journal publishes research communication or technical articles of current interest in measurement science; original work, tutorial or survey papers in any metrology related area; reviews and analytical studies in metrology; case studies on reliability, uncertainty in measurements; and reports and results of intercomparison and proficiency testing.
印度马班杂志计量学会是季刊。它专门用于计量 (科学，工业或法律)。通过发表有关科学，工业和法律计量学的独家文章，它满足了计量学家，尤其是质量实践者的重要需求。
该期刊发表对测量科学当前感兴趣的研究交流或技术文章; 在任何计量相关领域的原创工作，教程或调查论文; 计量学的评论和分析研究; 可靠性，测量不确定性的案例研究; 以及比较和能力测试的报告和结果。
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期刊ISSN
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0970-3950 |
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影响指数
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0.999 |
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最新CiteScore值
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1.90 查看CiteScore评价数据 |
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最新自引率
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43.10% |
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官方指定润色网址
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https://www.deeredit.com/?type=ss1 |
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投稿语言要求
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Improve the quality of the paper, eliminate grammar and spelling errors, increase readability, ensure accurate communication of viewpoints, enhance academic reputation, and increase the chances of the paper being accepted. 建议点击这个网址：https://www.deeredit.com/?type=ss2，资深审稿专家为您评估稿件质量，提供针对性改进建议，最终可助您极大提升目标期刊录用率 |
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期刊官方网址
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https://www.peipusci.com/?type=9 |
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杂志社征稿网址
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https://www.peipusci.com/?type=10 |
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通讯地址
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METROLOGY SOC INDIA, NPL PREMISES, DR K S KRISHNAN MARG, NEW DELHI, INDIA, 110 012 |
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偏重的研究方向（学科）
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工程技术-物理：应用 |
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出版周期
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Quarterly |
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出版年份
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2009 |
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出版国家/地区
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INDIA |
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是否OA
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No |
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SCI期刊coverage
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Science Citation Index Expanded（科学引文索引扩展） |
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NCBI查询
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PubMed Central (PMC)链接 全文检索(pubmed central) |
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最新中科院JCR分区
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大类(学科)
小类(学科)
综述期刊
工程技术
INSTRUMENTS & INSTRUMENTATION(仪器仪表)4区
PHYSICS, APPLIED(物理：应用)4区
否
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最新的影响因子
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0.999 | |||||
| 最新公布的期刊年发文量 |
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| 总被引频次 | 13 | |||||
| 影响因子趋势图 |
近年的影响因子趋势图（整体平稳趋势）
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2022年预警名单预测最新
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最新CiteScore值
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1.90
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| 年文章数 | 74 | ||||||||||
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SJR
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0.294 | ||||||||||
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SNIP
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0.973 | ||||||||||
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CiteScore排名
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| CiteScore趋势图 |
CiteScore趋势图
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本刊同领域相关期刊
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| 期刊名称 | IF值 |
| METROLOGIA | 3.125 |
| REVIEW OF SCIENTIFIC INSTRUMENTS | 1.508 |
| Journal of X-Ray Science and Technology | 1.52 |
| Quantitative InfraRed Thermography Journal | 1.65 |
| MAPAN-Journal of Metrology Society of India | 0.999 |
| Nanoscale | 7.712 |
| Nanotechnology Reviews | 7.77 |
| Applied Sciences-Basel | 2.652 |
| Journal of Experimental Nanoscience | 3.044 |
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本刊同分区等级的相关期刊
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| 期刊名称 | IF值 |
| REVIEW OF SCIENTIFIC INSTRUMENTS | 1.508 |
| Journal of X-Ray Science and Technology | 1.52 |
| Quantitative InfraRed Thermography Journal | 1.65 |
| MAPAN-Journal of Metrology Society of India | 0.999 |
| ATOMIZATION AND SPRAYS | 0.811 |
| International Journal of Surface Science and Engineering | 1.166 |
| QUANTUM ELECTRONICS | 1.012 |
| OPTO-ELECTRONICS REVIEW | 2.464 |
| MICROELECTRONIC ENGINEERING | 2.498 |
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