REVIEW OF SCIENTIFIC INSTRUMENTS 期刊简介
Review of Scientific Instruments, is committed to the publication of advances in scientific instruments, apparatuses, and techniques. RSI seeks to meet the needs of engineers and scientists in physics, chemistry, and the life sciences.
《科学仪器评论》,致力于出版科学仪器,仪器和技术的进展。RSI旨在满足物理,化学和生命科学领域的工程师和科学家的需求。
期刊ISSN
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0034-6748 |
影响指数
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1.508 |
最新CiteScore值
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2.90 查看CiteScore评价数据 |
最新自引率
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10.60% |
官方指定润色网址
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https://www.deeredit.com/?type=ss1 |
投稿语言要求
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Improve the quality of the paper, eliminate grammar and spelling errors, increase readability, ensure accurate communication of viewpoints, enhance academic reputation, and increase the chances of the paper being accepted. 建议点击这个网址:https://www.deeredit.com/?type=ss2,资深审稿专家为您评估稿件质量,提供针对性改进建议,最终可助您极大提升目标期刊录用率 |
期刊官方网址
hot |
https://www.peipusci.com/?type=9 |
杂志社征稿网址
hot |
https://www.peipusci.com/?type=10 |
通讯地址
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AMER INST PHYSICS, CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1, MELVILLE, USA, NY, 11747-4501 |
偏重的研究方向(学科)
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工程技术-物理:应用 |
出版周期
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Monthly |
出版年份
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0 |
出版国家/地区
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UNITED STATES |
是否OA
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No |
SCI期刊coverage
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Science Citation Index Expanded(科学引文索引扩展) |
NCBI查询
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PubMed Central (PMC)链接 全文检索(pubmed central) |
最新中科院JCR分区
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大类(学科)
小类(学科)
综述期刊
工程技术
INSTRUMENTS & INSTRUMENTATION(仪器仪表)4区
PHYSICS, APPLIED(物理:应用)4区
否
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最新的影响因子
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1.508 | |||||
最新公布的期刊年发文量 |
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总被引频次 | 145 | |||||
影响因子趋势图 |
近年的影响因子趋势图(整体平稳趋势)
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2022年预警名单预测最新
最新CiteScore值
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2.90
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年文章数 | 940 | ||||||||||
SJR
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0.605 | ||||||||||
SNIP
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0.870 | ||||||||||
CiteScore排名
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CiteScore趋势图 |
CiteScore趋势图
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本刊同领域相关期刊
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|
期刊名称 | IF值 |
METROLOGIA | 3.125 |
REVIEW OF SCIENTIFIC INSTRUMENTS | 1.508 |
Journal of X-Ray Science and Technology | 1.52 |
Quantitative InfraRed Thermography Journal | 1.65 |
MAPAN-Journal of Metrology Society of India | 0.999 |
Nanoscale | 7.712 |
Nanotechnology Reviews | 7.77 |
Applied Sciences-Basel | 2.652 |
Journal of Experimental Nanoscience | 3.044 |
本刊同分区等级的相关期刊
|
|
期刊名称 | IF值 |
REVIEW OF SCIENTIFIC INSTRUMENTS | 1.508 |
Journal of X-Ray Science and Technology | 1.52 |
Quantitative InfraRed Thermography Journal | 1.65 |
MAPAN-Journal of Metrology Society of India | 0.999 |
ATOMIZATION AND SPRAYS | 0.811 |
International Journal of Surface Science and Engineering | 1.166 |
QUANTUM ELECTRONICS | 1.012 |
OPTO-ELECTRONICS REVIEW | 2.464 |
MICROELECTRONIC ENGINEERING | 2.498 |
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