MICROELECTRONICS JOURNAL 期刊简介

MICROELECTRONICS JOURNAL
英文简介:

Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems.

The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc.

Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.

中文简介:(来自Google、百度翻译)

《微电子杂志》1969年出版,是传播微电子系统,电路和新兴技术的研究和应用的国际论坛。发表在《微电子杂志》上的论文经过同行评审,以确保原创性,相关性和及时性。因此,该期刊提供了有关微电子电路和系统的全球,定期和全面的更新。
微电子期刊邀请论文描述以下所有领域的重要研究和应用。还将考虑涵盖最近发展的综合审查/调查文件。微电子杂志涵盖电路和系统。本主题包括但不限于: 模拟、数字、混合和射频电路及相关设计方法; 逻辑、体系结构和系统级综合; 测试、可测试性设计、内置自测试; 区域、功率和热分析和设计; 混合域仿真和设计; 嵌入式系统; 非冯·诺依曼计算及相关技术和电路; 高复杂度系统集成的设计和测试; SoC、NoC、SIP和NIP设计和测试; 3-D集成设计和分析; 新兴器件技术和电路,如FinFETs、set、自旋电子学,SFQ,MTJ等应用方面也受到欢迎,例如信号和图像处理,包括密码学电路,传感器和执行器,包括传感器网络,可靠性和质量问题以及经济模型。

期刊ISSN
0026-2692
影响指数
1.589
最新CiteScore值
3.00 查看CiteScore评价数据
最新自引率
9.50%
官方指定润色网址
https://www.deeredit.com/?type=ss1
投稿语言要求

Improve the quality of the paper, eliminate grammar and spelling errors, increase readability, ensure accurate communication of viewpoints, enhance academic reputation, and increase the chances of the paper being accepted.

建议点击这个网址:https://www.deeredit.com/?type=ss2,资深审稿专家为您评估稿件质量,提供针对性改进建议,最终可助您极大提升目标期刊录用率

期刊官方网址

hot

https://www.peipusci.com/?type=9
杂志社征稿网址

hot

https://www.peipusci.com/?type=10
通讯地址
ELSEVIER SCI LTD, THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD, ENGLAND, OXON, OX5 1GB
偏重的研究方向(学科)
工程技术-工程:电子与电气
出版周期
Monthly
出版年份
0
出版国家/地区
ENGLAND
是否OA
No
SCI期刊coverage
Science Citation Index Expanded(科学引文索引扩展)
NCBI查询
PubMed Central (PMC)链接 全文检索(pubmed central)
MICROELECTRONICS JOURNAL 期刊中科院JCR 评价数据
最新中科院JCR分区
大类(学科)
小类(学科)
综述期刊
工程技术
ENGINEERING, ELECTRICAL & ELECTRONIC(工程:电子与电气)4区 NANOSCIENCE & NANOTECHNOLOGY(纳米科技)4区
最新的影响因子
1.589
最新公布的期刊年发文量
年度总发文量 研究类文章占比
170 99.41%
总被引频次 59
影响因子趋势图
近年的影响因子趋势图(整体平稳趋势)

2022年预警名单预测最新

MICROELECTRONICS JOURNAL 期刊CiteScore评价数据
最新CiteScore值
3.00
年文章数 170
SJR
0.289
SNIP
0.903
CiteScore排名
序号 类别(学科) 排名 百分位
1 Materials Science Surfaces, Coatings and Films #55/123
2 Materials Science Electrical and Electronic Engineering #311/693
3 Materials Science Condensed Matter Physics #203/411
4 Materials Science Atomic and Molecular Physics, and Optics #96/192
5 Materials Science Electronic, Optical and Magnetic Materials #126/246
CiteScore趋势图
CiteScore趋势图
MICROELECTRONICS JOURNAL 投稿经验(由下方点评分析获得,7人参与,2665人阅读)
投稿录用比例: 容易
审稿速度: 约3.0个月
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